HALCHENKO, Volodymyr Y.; TREMBOVETSKA, Ruslana; TYCHKOV, Volodymyr; TYCHKOVA, Nataliia. Surrogate methods for determining profiles of material properties of planar test objects with accumulation of apriori information about tchem. Archives of Electrical Engineering , [S. l.], v. 73, n. 1, p. 183–200, 2024. DOI: 10.24425/aee.2024.148864. Disponível em: https://wydawnictwo.pan.pl/index.php/aee/article/view/5856. Acesso em: 17 oct. 2026.