Unconventional Applications of Electron Backscattering Diffraction (EBSD) in Metallic Materials

Abstract

Electron backscattered diffraction is widely used for phase and orientation imaging of crystalline specimens. Despite the inherent complexity of diffraction images, current analysis methodologies typically focus on the position of Kikuchi bands or direct comparisons between experimental and simulated patterns. These approaches require prior knowledge of the phases to be analyzed, limiting their applicability in certain scenarios. This paper introduces an alternative methodology, crystallographic analysis of lattice metric, which extracts phase and orientation information directly from the registered diffraction pattern without requiring predefined standards. The paper outlines the methodology, discusses limitations, and demonstrates possible application in phase analysis, lattice parameter ratio mapping, and qualitative lattice distortion mapping.