KHARCHENKO, Vyacheslav; PONOCHOVNYI, Yuriy; VDOVICHENKO, Oleksandr; DUBNITSKIY, Valeriy; MEDVID, Viktoriia. Extended multi-fragment Markov models of programmable devices with controlled degradation considering hidden failures. International Journal of Electronics and Telecommunications, [S. l.], v. 72, n. 3, p. 1–9, 2026. DOI: 10.24425/ijet.2026.157952. Disponível em: https://wydawnictwo.pan.pl/index.php/ijet/article/view/2946. Acesso em: 1 sep. 2026.