Kharchenko, Vyacheslav, Yuriy Ponochovnyi, Oleksandr Vdovichenko, Valeriy Dubnitskiy, and Viktoriia Medvid. “Extended Multi-Fragment Markov Models of Programmable Devices With Controlled Degradation Considering Hidden Failures”. International Journal of Electronics and Telecommunications 72, no. 3 (July 31, 2026): 1–9. Accessed August 31, 2026. https://wydawnictwo.pan.pl/index.php/ijet/article/view/2946.