GEISLER, Tobias; MANNS, Martin. Layer thickness measurement of technically anodised aluminium surfaces by using goniometric scattered light. Metrology and Measurement Systems, [S. l.], v. 28, n. 2, p. 371–382, 2021. DOI: 10.24425/mms.2021.136613. Disponível em: https://wydawnictwo.pan.pl/index.php/mms/article/view/5122. Acesso em: 16 oct. 2026.