LI, Zhen; GRÖGER, Sophie. Investigation of noise in surface topography measurement using structured illumination microscopy. Metrology and Measurement Systems, [S. l.], v. 28, n. 4, p. 767–779, 2021. DOI: 10.24425/mms.2021.137706. Disponível em: https://wydawnictwo.pan.pl/index.php/mms/article/view/5148. Acesso em: 15 oct. 2026.