ODRZYWOLSKI, Sebastian; KOJDECKI, Marek Andrzej; ZŁOTNIK, Sebastian; KUBISZYN, Łukasz; WRÓBEL, Jarosław. Quantification of microstructural homogeneity in indium arsenide epilayers by X-ray diffraction. Metrology and Measurement Systems, [S. l.], v. 31, n. 2, p. 231–257, 2024. DOI: 10.24425/mms.2024.149700. Disponível em: https://wydawnictwo.pan.pl/index.php/mms/article/view/5265. Acesso em: 15 oct. 2026.