FRANKOWSKI, Robert; GURSKI, Maciej; SZPLET, Ryszard. Kintex ultrascale’s multi-segment digital tapped delay lines with controlled characteristics for precise time-to-digital conversion. Metrology and Measurement Systems, [S. l.], v. 31, n. 2, p. 417–429, 2024. DOI: 10.24425/mms.2024.149697. Disponível em: https://wydawnictwo.pan.pl/index.php/mms/article/view/5276. Acesso em: 15 oct. 2026.