POKRYSZKA, Piotr; KIJASZEK, Wojciech; PATELA, Sergiusz; STAFINIAK, Andrzej; WOŚKO, Mateusz; PASZKIEWICZ, Regina. In-situ characterization of GaN material using Reflectance Spectroscopy. Metrology and Measurement Systems, [S. l.], v. 32, n. 1, p. art. no. 12, 1–12, 2025. DOI: 10.24425/mms.2025.152780. Disponível em: https://wydawnictwo.pan.pl/index.php/mms/article/view/5315. Acesso em: 15 oct. 2026.