CHEN, Yueping; WEI, Sian; MA, Jiegao. Research on an improved ant colony algorithm for optimizing the inspection path of free-form surfaces. Metrology and Measurement Systems, [S. l.], v. 32, n. 2, p. art. no. 15, 1–17, 2025. DOI: 10.24425/mms.2025.154343. Disponível em: https://wydawnictwo.pan.pl/index.php/mms/article/view/5330. Acesso em: 15 oct. 2026.