P. Pokryszka, W. Kijaszek, S. Patela, A. Stafiniak, M. Wośko, and R. Paszkiewicz, “In-situ characterization of GaN material using Reflectance Spectroscopy”, mms, vol. 32, no. 1, pp. art. no. 12, 1–12, Mar. 2025.