Chrzanowski, Krzysztof. “Critical Review of Present-Day Methodology of Thermal Imager Noise Characterization”. Metrology and Measurement Systems 32, no. 2 (June 30, 2025): art. no. 6, 1–21. Accessed October 15, 2026. https://wydawnictwo.pan.pl/index.php/mms/article/view/5321.