Pokryszka P, Kijaszek W, Patela S, Stafiniak A, Wośko M, Paszkiewicz R. In-situ characterization of GaN material using Reflectance Spectroscopy. mms [Internet]. 2025 Mar. 30 [cited 2026 Oct. 16];32(1):art. no. 12, 1-12. Available from: https://wydawnictwo.pan.pl/index.php/mms/article/view/5315