A camera for scanning objects in motion based on an integrated detection system working in on-chip TDI mode

Abstract

The paper presents an X-ray camera for testing moving objects. A typical application of such cameras is scanning products on an industrial production line. Currently, the most popular device detecting radiation in this type of camera consists of a pixel line based on scintillator detectors. Unfortunately, increasing its resolution automatically involves reducing the pixel size and reducing the signal-to-noise ratio. This is where the time domain integration method comes in handy, increasing the resolution without degrading the signal-to-noise ratio. The camera presented in this paper is based on an application-specific integrated circuit dedicated to this purpose. The application-specific integrated circuit core is a pixel matrix operating in a single-photon counting mode. Its architecture was designed to implement the time domain integration method and construct high-resolution cameras with a large scanning area. The article also describes the hardware and software of the application-specific integrated circuit readout system.