Review of X-ray detection systems

Authors

  • Paweł Urbański  Faculty of Electronics, Photonics and Microsystems, Wrocław University of Science and Technology, ul. Janiszewskiego 11/17, 50-372 Wrocław, Poland https://orcid.org/0009-0001-7643-3182
  • Tomasz Grzebyk Faculty of Electronics, Photonics and Microsystems, Wrocław University of Science and Technology, ul. Janiszewskiego 11/17, 50-372 Wrocław, Poland https://orcid.org/0000-0002-2283-0027

DOI:

https://doi.org/10.24425/opelre.2023.146554

Abstract

The article presents an overview and a classification of X-ray detection methods. The main motivation for its preparation was the need to select a suitable and useful method for detecting signals from a currently developed miniature micro-electro-mechanical system (MEMS) X-ray source. The described methods were divided into passive and active ones, among which can be distinguished: chemical, luminescent, thermo-luminescent, gas ionization, semiconductor, and calorimetric methods. The advantages and drawbacks of each method were underlined, as well as their usefulness for the characterisation of the miniature MEMS X-ray source.

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Published

2026-03-13

How to Cite

Urbański , Paweł, and Tomasz Grzebyk. “Review of X-Ray Detection Systems”. Opto-Electronics Review, vol. 31, no. 3, Mar. 2026, p. e146554, doi:10.24425/opelre.2023.146554.

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