[1]
Obstarczyk, A. et al. 2026. Analysis of the impact of post-process modifications on the properties of TiO2 thin films with high-temperature stable anatase phase deposited by the electron beam evaporation method. Opto-Electronics Review. 32, 4 (Mar. 2026), e151991. DOI:https://doi.org/10.24425/opelre.2024.151991.