ANDRIYEVSKY, Bohdan; BYCHTO, Leszek; PATRYN, Aleksy; SCHADE, Ulrich; PUSKAR, Ljiljana; VEBER, Alexander; ABROSIMOV, Nikolay; KASHUBA, Andrii I. Investigations of free electrons in doped silicon crystals derived from Fourier transformed infrared measurements and ab initio calculations. Opto-Electronics Review, [S. l.], v. 33, n. 1, p. e153756 , 2026. DOI: 10.24425/opelre.2025.153756. Disponível em: https://wydawnictwo.pan.pl/index.php/opelre/article/view/288. Acesso em: 17 apr. 2026.