MAJKOWYCZ, Kinga; KOPYTKO, Małgorzata; MURAWSKI, Krzysztof; MARTYNIUK, Piotr. The method for extracting defect levels in the MCT multilayer low-bandgap heterostructures. Opto-Electronics Review, [S. l.], v. 32, n. 1, p. e149182 , 2026. DOI: 10.24425/opelre.2024.149182. Disponível em: https://wydawnictwo.pan.pl/index.php/opelre/article/view/350. Acesso em: 17 apr. 2026.