BOGUSKI, Jacek et al. Multi-technique characterisation of InAs-on-GaAs wafers with circular defect pattern. Opto-Electronics Review, [S. l.], p. e144564, 2026. DOI: 10.24425/opelre.2023.144564. Disponível em: https://wydawnictwo.pan.pl/index.php/opelre/article/view/447. Acesso em: 17 apr. 2026.