FRASER, Everett D.; SHAO, Jiayi; FRENSLEY, Paul W.; BARNES, Beau D.; CLARK, Kevin P.; KAO, Yung-Chung; PINSUKANJANA, Paul R. Status of multi-wafer production MBE capabilities for extended SWIR III-V epi materials for IR detection. Opto-Electronics Review, [S. l.], p. e144571, 2026. DOI: 10.24425/opelre.2023.144571. Disponível em: https://wydawnictwo.pan.pl/index.php/opelre/article/view/454. Acesso em: 17 apr. 2026.