STROKA, Stefan M.; HEUMANN, Christian; SUHRKE, Fabian; MEINDL, Kathrin. A probabilistic approach for approximation of optical and opto-electronic properties of an opto-semiconductor wafer under consideration of measuring inaccuracy and model uncertainty. Opto-Electronics Review, [S. l.], v. 31, n. 2, p. e145863, 2026. DOI: 10.24425/opelre.2023.145863. Disponível em: https://wydawnictwo.pan.pl/index.php/opelre/article/view/464. Acesso em: 17 apr. 2026.