ROGALSKI, Antoni. Van der Waals materials for HOT infrared detectors: A review. Opto-Electronics Review, [S. l.], v. 30, n. 1, p. e140551, 2026. DOI: 10.24425/opelre.2022.140551. Disponível em: https://wydawnictwo.pan.pl/index.php/opelre/article/view/498. Acesso em: 17 apr. 2026.