PISKORSKI, Michał; ROGALA, Maciej; DĄBROWSKI, Paweł; LUTSYK, Iaroslav; KOZŁOWSKI, Witold; KOWALCZYK, Paweł J.; KRUKOWSKI, Paweł. Integration of a Raman spectroscopy system with a low-temperature scanning tunnelling microscope under UHV conditions. Opto-Electronics Review, [S. l.], v. 34, n. 3, p. 6092, 2026. DOI: 10.24425/opelre.2026.6092. Disponível em: https://wydawnictwo.pan.pl/index.php/opelre/article/view/6092. Acesso em: 10 oct. 2026.