Marczewski, J. (2026) “THz detectors based on Si-CMOS technology field effect transistors – advantages, limitations and perspectives for THz imaging and spectroscopy”, Opto-Electronics Review, 26(4), pp. 261–269. Available at: https://wydawnictwo.pan.pl/index.php/opelre/article/view/698 (Accessed: 14 May 2026).