Majkowycz, Kinga, Małgorzata Kopytko, Krzysztof Murawski, and Piotr Martyniuk. “The Method for Extracting Defect Levels in the MCT Multilayer Low-Bandgap Heterostructures”. Opto-Electronics Review 32, no. 1 (February 18, 2024): e149182 . Accessed August 18, 2026. https://wydawnictwo.pan.pl/index.php/opelre/article/view/350.