Boguski, Jacek, Jarosław Wróbel, Sebastian Złotnik, Bogusław Budner, Malwina Liszewska, Łukasz Kubiszyn, Paweł P. Michałowski, et al. “Multi-Technique Characterisation of InAs-on-GaAs Wafers With Circular Defect Pattern”. Opto-Electronics Review (March 11, 2026): e144564. Accessed April 17, 2026. https://wydawnictwo.pan.pl/index.php/opelre/article/view/447.