Piskorski M, Rogala M, Dąbrowski P, Lutsyk I, Kozłowski W, Kowalczyk PJ, et al. Integration of a Raman spectroscopy system with a low-temperature scanning tunnelling microscope under UHV conditions. Opto-Electron. Rev. [Internet]. 2026 Sep. 15 [cited 2026 Oct. 10];34(3):6092. Available from: https://wydawnictwo.pan.pl/index.php/opelre/article/view/6092