A few-shot fine-grained image recognition method

Authors

  • Jianwei Wang College of Computer Science and Technology, Harbin University of Science and Technology, Harbin 150080, China;College of Computer Science and Technology, Heilongjiang Institute of Technology, Harbin 150050, China https://orcid.org/0000-0002-9501-5410
  • Deyun Chen College of Computer Science and Technology, Harbin University of Science and Technology, Harbin 150080, China

DOI:

https://doi.org/10.24425/bpasts.2023.144584

Keywords

few-shot learning, attention metric, CNN (convolutional neural network), feature expression

Abstract

.

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Published

2023-01-02

How to Cite

Wang, Jianwei, and Deyun Chen. “A Few-Shot Fine-Grained Image Recognition Method”. Bulletin of the Polish Academy of Sciences Technical Sciences, vol. 71, no. 1, Jan. 2023, p. e144584, doi:10.24425/bpasts.2023.144584.

Issue

Vol. 71 No. 1 (2023): (contains i.a. Special Section on Lightweight structures in civil engineering – contemporary problems)

Section

Articles

License

Copyright (c) 2026 Bulletin of the Polish Academy of Sciences Technical Sciences

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.

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