About the Journal

Metrology and Measurement Systems is an international, peer‑reviewed journal published quarterly since its launch in 1988. It has been published in English since 2001. Since 2024, the journal has been available exclusively in electronic form on the platform of the Electronic Library of the Polish Academy of Sciences. It follows a diamond open access model, in which authors are not charged any publication fees, and all articles are made freely available under the Creative Commons Attribution–NonCommercial–NoDerivatives 4.0 License (CC BY‑NC‑ND 4.0).

The Journal is indexed in, among others, Web of Science (Core Collection), Scopus, and Google Scholar, and its metrics are listed in Journal Citation Reports (Clarivate Analytics).

Contributions are invited on all aspects of research, development, and applications in measurement science and associated technologies.

The scope of the journal includes, but is not limited to: theory, general principles, and applications of measurement; measurement of physical, chemical, and biological quantities; medical measurements; sensors and transducers; measurement data acquisition; measurement signal transmission; signal processing and data analysis; measurement systems, including embedded systems; and the design, manufacture, and evaluation of measurement instrumentation. Manuscripts should emphasize the novelty of the presented methods and/or techniques and demonstrate their performance through experimental tests, reliable simulations, or numerical examples. Articles directly concerning measurement processes should include an adequate analysis of measurement uncertainty.

The average publication cycle is 6 months.

Article types

Metrology and Measurement Systems welcomes submissions of the following article types:

  • Invited papers or review papers presenting the current state of knowledge within the scope of the journal (max. 20 edited pages, approximately 3,000 characters per page).
  • Research papers reporting original scientific or technological advancements in the field of metrology (max. 12 pages).
  • Papers based on extended and updated contributions presented at scientific conferences (max. 12 pages).

Frequency

Metrology and Measurement Systems is a quarterly journal, publishing four issues per year. Articles accepted for publication are made available online immediately, with an assigned DOI.

Peer review

Each submitted manuscript undergoes a single-blind peer-review process, in which reviewers know the identity of the authors, but authors do not know the identity of reviewers. Publication decisions are based on the reviewers’ comments. If necessary, authors may be invited to revise their manuscripts. In the case of revisions, authors are required to include a response letter detailing their answers to the reviewers’ and editor’s comments and to clearly indicate in the manuscript the changes made.

Prior to submission for review, our editors verify the scope of the manuscript and its relevance to the field of Instrumentation and Measurement. An essential criterion for evaluation is the manuscript’s potential impact on the research field, measured by the number of citations. Manuscripts with higher potential impact are preferred during evaluation and at the publication stage.

Our Internet Editorial System provides authors with up-to-date information on the progress of the review process.

Open access

Metrology and Measurement Systems operates under a diamond open access model, where authors do not pay any publication fees, and all articles are made freely available under the terms of the Creative Commons Attribution–NonCommercial–NoDerivatives 4.0 License (CC BY‑NC‑ND 4.0).

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