Critical review of present-day methodology of thermal imager noise characterization
DOI:
https://doi.org/10.24425/mms.2025.154668Abstract
This paper presents a review of reasons that create metrological chaos in the field of characterization of noise in thermal imagers. In detail, the paper presents a critical review of myriads of past and present-day definitions/measurement methods of noise parameters of thermal imagers that create this chaos and significantly reduce reproducibility of measurement of noise parameters carried out by different test teams.References
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