Low-noise high-resolution CMOS readout ASIC for silicon strip X-ray detectors

Abstract

This work presents the design, characterisation, and measurement results of the silicon strip sensor readout circuit for X-ray applications. The key design goals were a noise level below 50 electrons rms, low power consumption (below 10 mW per channel) and a compact layout. The prototype integrated circuit was designed and fabricated in a 180 nm CMOS technology, incorporating eight charge-processing channels, biasing circuits, reset and baseline restoration logic, and a calibration system.