Dark current behaviour of type-II superlattice longwave infrared photodetectors under proton irradiation

Authors

  • Clara Bataillon University of Montpellier, 163 Auguste Broussonnet St., 34090 Montpellier, France
  • Jean-Phillipe Perez University of Montpellier, 163 Auguste Broussonnet St., 34090 Montpellier, France
  • Rodolphe Alchaar University of Montpellier, 163 Auguste Broussonnet St., 34090 Montpellier, France
  • Alain Michez University of Montpellier, 163 Auguste Broussonnet St., 34090 Montpellier, France
  • Olivier Gilard CNES, 18 Edouard Belin Ave., 31400 Toulouse, France
  • Olivier Saint-Pé Airbus Defense & Space, 31 des Cosmonautes St., 31400 Toulouse, France
  • Philippe Christol University of Montpellier, 163 Auguste Broussonnet St., 34090 Montpellier, France

DOI:

https://doi.org/10.24425/opelre.2023.144552

Abstract

In this work, the authors investigated the influence of proton-irradiation on the dark current of XBp longwave infrared InAs/GaSb type-II superlattice barrier detectors, showing a cut-off wavelength from 11 µm to 13 µm at 80 K. The proton irradiations were performed with 63 MeV protons and fluences up to 8∙1011 H+/cm² on a type-II superlattice detector kept at cryogenic (100 K) or room temperature (300 K). The irradiation temperature of the detector is a key parameter influencing the effects of proton irradiation. The dark current density increases due to displacement damage dose effects and this increase is more important when the detector is proton-irradiated at room temperature rather than at cryogenic temperature.

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Published

2026-03-11

How to Cite

Bataillon, Clara, et al. “Dark Current Behaviour of Type-II Superlattice Longwave Infrared Photodetectors under Proton Irradiation”. Opto-Electronics Review, Mar. 2026, p. e144552, doi:10.24425/opelre.2023.144552.

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